Improved Scanning Capability with EMD’s Contact Scanning Probe.
|
EMD Inc. has improved the scanning characteristics of the Contact Scanning Probes by up to as much as 50% more accuracy when using longer stylus extensions. The new probes utilize new spring technology which, when used in conjunction with our latest software, shows an impressive 50% increase in accuracy when scanning around the calibration sphere. The difference in probe accuracy for styli under 3 inches in length is negligible. The new spring rate is slightly different from the older springs that were used in the Sceptre Probes. It is recommended that the new probes be tuned-up to the existing software for proper functionality. This includes measuring the probe force, adjusting the probe potentiometers, and modifying the probe multipliers. These
test were performed with a 200mm by 19mm diameter extension with a 114.5mm by
8mm diameter ruby ball. |
|
![]() |
![]() |
|
Results
from a v3 test. |
|
![]() |
![]() |
|
These test were performed with a 200mm by 19mm diameter extension with a 114.5mm by 8mm diameter ruby ball. A calibration was preformed followed by a counter clockwise scan then a clockwise scan on the calibration ball. Results are from a new probe with two reinforced z mounting brackets one for the cube and one for the helmet, double 0.14inch centerless ground springs and reinforce titanium cube brackets |
|
![]() |
![]() |
|
Results from a v3 test. |
|
![]() |
![]() |